The Advanced Electron Microscopy Center (AEMC) enables sample preparation and electron and ion microscopy imaging and analysis for the University of Hawai‘i research community as well as other research institutions and industrial clients. At the heart of the AEMC are two powerful instruments: a dual beam Focused Ion Beam instrument and a monochromated and aberration-corrected (Scanning) Transmission Electron Microscope. This talk will introduce the instruments, their capabilities and examples of their application to a variety of materials. For AEMC details, see www.soest.hawaii.edu/AEMC/.